Ahmed Ahtaiba*

Electrical and Electronic Engineering Department, Sirte University, Sirte, Liby

*Corresponding Author: Ahmed Ahtaiba, Electrical and Electronic Engineering Department, Sirte University, Sirte, Libya.

Received: March 05, 2025; Published: March 19, 2025

Abstract

Atomic force microscopes (AFMs) can measure the surfaces of metals, semiconductors, and insulators. These microscopes can function in various environments, such as vacuum, liquids, or air, and are highly sensitive to atomic forces. AFMs are regarded as extremely high-resolution tools, used for imaging, measuring, manipulating, and probing objects at the micro and nano scales. Unlike other high-resolution microscopes, such as the Scanning Tunneling Microscope (STM), AFMs can examine both conductive and non-conductive materials. In this paper, we present the computer simulation results for morphological deconvolution (dilation and erosion).

Keywords: AFM; Erosion; Dilation Image Restoration; AFM Tip; Morphological Deconvolution

References

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Citation

Citation: Ahmed Ahtaiba. “Testing and Comparing the Original Image with the Restored Image that was Obtained by Using the Erosion of the Dilated Image by the AFM Tip".Acta Scientific Computer Sciences 7.1 (2025): 23-28.

Copyright

Copyright: © 2025 Ahmed Ahtaiba. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.